Repeatability
Variation when the same appraiser measures the same part repeatedly using the same method and equipment under the same conditions.
Understand the complete Measurement System Analysis framework, learn how Gauge Repeatability and Reproducibility fits within MSA, explore practical examples, calculate a crossed variable Gauge R&R study, and build a controlled measurement-system project with portable JSON and a professional report.
Variation when the same appraiser measures the same part repeatedly using the same method and equipment under the same conditions.
Variation caused by different appraisers, fixtures, stations or other defined measurement conditions.
The real variation between the selected parts. A useful study needs parts covering the expected process range.
| Component | Meaning | Desired condition | Typical action when poor |
|---|---|---|---|
| Total observed variation | Combined part variation and measurement-system variation. | Dominated by real part-to-part differences. | Separate measurement error before interpreting process performance. |
| Equipment variation (EV) | Repeatability of the device, method, fixture and short-term conditions. | Small relative to process or tolerance. | Improve resolution, fixturing, method, environment, maintenance or equipment. |
| Appraiser variation (AV) | Reproducibility between appraisers or defined operating conditions. | Operators reach equivalent results. | Clarify method, datum, force, alignment, training and interpretation. |
| Gauge R&R | Combined EV and AV. | Appropriate for risk and intended use. | Reduce measurement-system sources before accepting data. |
| Part variation (PV) | Actual differences among study parts. | Clearly distinguishable from measurement noise. | Select a more representative study range if PV is too narrow. |
| Indicator | Common interpretation | Important caution |
|---|---|---|
| < 10% Gauge R&R | Generally considered acceptable. | Still review ndc, bias, resolution, risk and study validity. |
| 10% to 30% | May be acceptable depending on application, cost, risk and improvement feasibility. | Document the technical justification and intended use. |
| > 30% | Generally unacceptable. | Investigate EV and AV separately before choosing corrective action. |
| ndc ≥ 5 | Often used as a minimum indication that the system can distinguish useful categories. | Higher discrimination may be needed for SPC, tight tolerance or key characteristics. |
| Resolution | A practical rule is that display resolution should be small relative to process or tolerance width. | Display resolution alone does not prove capability. |
Study: Variable crossed Gauge R&R using 10 parts, 3 appraisers and 3 trials.
Finding: High EV but low AV.
Likely causes: poor fixture, inconsistent measuring force, worn contacts or insufficient gauge resolution.
Study: Bias, stability and Gauge R&R.
Finding: Acceptable R&R but drift over several weeks.
Likely causes: probe wear, reference foil deterioration, substrate effects or calibration-control weakness.
Study: Attribute agreement analysis using known reference samples.
Finding: Inspectors agree with themselves but disagree with the reference standard.
Likely causes: unclear defect criteria, poor lighting, inconsistent viewing distance or inadequate boundary samples.
Study: Bias, stability and system-level comparison.
Finding: Recorder and independent reference differ across the operating range.
Likely causes: sensor location, extension-wire error, channel correction, calibration bias or thermal gradients.
Study: Crossed Gauge R&R with representative fastener joints.
Finding: Strong appraiser-by-part interaction.
Likely causes: different reaction technique, alignment, seating method or interpretation of breakaway torque.
Study: Attribute agreement and software verification.
Finding: Data-entry rules are repeatable but the master-data reference is wrong.
Likely causes: incorrect specification logic, obsolete revision or uncontrolled lookup tables.