1. Define the Top Event
State a specific undesired condition, not a vague phrase such as “system failure”. Include the function, condition and boundary where practical. Example: Loss of commanded actuator movement when movement is required.
Build a top-down Boolean model of credible event combinations that can produce a defined undesired top event. Analyse minimal cut sets, single-point paths, dependencies and optional quantitative probability with explicit exposure assumptions.
State a specific undesired condition, not a vague phrase such as “system failure”. Include the function, condition and boundary where practical. Example: Loss of commanded actuator movement when movement is required.
Document what is inside and outside the analysis, operating state, mission phase, environmental conditions, interfaces, assumptions and exclusions. The same top event can have a different tree under different operating conditions.
Ask: What immediate events can cause this event? Decompose each intermediate event until the analysis reaches basic or deliberately undeveloped events supported by evidence, data or another analysis.
A rectangular event represents a system state or failure condition that is further developed through lower-level causes. The top event is simply the highest event in the analysis.
A basic event is developed no further in this tree because it is sufficiently defined for the purpose of the analysis. It may be linked to reliability data, a component failure mode, a process condition or another supporting analysis.
An undeveloped event is intentionally not analysed further, often because information is unavailable, the event is outside scope, or development is unnecessary for the decision being supported. Record the stopping rationale.
The output event occurs if one or more of its input events occur. An OR branch can therefore create single-event paths to the top event. Do not use OR merely because several possible causes exist — confirm each input is individually sufficient.
The output event occurs only when all specified input events occur in the required condition. AND gates are common in redundant/protected architectures, but apparent redundancy does not prove statistical independence.
Large FTAs are often modular. A complex event can be developed in another tree, subsystem analysis or specialist study. This app keeps the primary tree simple, so use evidence and notes to reference supporting analyses where necessary.
A minimal cut set is the smallest combination of terminal events sufficient to cause the top event according to the tree logic. If any event can be removed and the combination no longer causes the top event, the set is minimal.
An order-1 cut set contains one event, order-2 contains two events, and so on. Lower-order sets often deserve attention because fewer coincident failures are required, but consequence and exposure still matter.
An order-1 minimal cut set means one terminal event alone can produce the top event. This can identify a single-point vulnerability, but whether it is acceptable depends on the applicable safety, reliability and design framework.
Checks the causal structure: completeness of credible pathways, correct gate logic, minimal cut sets, single-point contributors, dependencies, common causes and model boundaries. It remains useful even when trustworthy numerical reliability data are unavailable.
Adds probabilities or rates to terminal events and propagates them through the tree. Quantification can help compare contributors and estimate top-event probability, but numerical precision does not compensate for poor logic, missing causes or unjustified independence assumptions.
Use where a probability for the relevant exposure interval is already justified. Always state the basis: per mission, per demand, per operating interval, per item population, or another defined exposure.
For a constant hazard rate λ over a mission/exposure time t, this app calculates P = 1 − e−λt. This is an assumption-based model and is not suitable for every failure mechanism or lifecycle phase.
Observed failures divided by relevant opportunities can provide an empirical estimate, but the population must be comparable, sufficiently large and exposure-consistent. Small samples can produce unstable estimates.
Two nominally redundant channels may both depend on one supply, protection device, ground path, connector or distribution unit.
Temperature, vibration, moisture, contamination, fire, EMI or physical damage may defeat multiple items simultaneously.
Common algorithms, requirements, libraries, processors, component types or design errors can make failures correlated.
A common supplier, material batch, special process, tooling issue, configuration error or inspection weakness may affect redundant items alike.
A single maintenance action, incorrect procedure, configuration change or access error can defeat multiple protective paths.
A protective function may fail silently and remain unavailable until another event occurs. Exposure time and proof-test/diagnostic effectiveness can therefore become important.
Starts with item or process failure modes and asks what local and higher-level effects may result. It is strong for systematic coverage of component/process failure modes.
Starts with one selected undesirable outcome and asks what combinations of events can cause it. It is particularly strong for redundancy, multiple-failure combinations, safety-critical top events and identifying single-point paths.
Top event, purpose, boundary, operating state, interfaces, assumptions and acceptance/review authority.
Identify immediate credible causes and connect them using the correct AND/OR relationship.
Continue until meaningful basic/undeveloped events are reached and stopping rules are justified.
Challenge completeness, duplicated events, circular logic, event wording, branch sufficiency and common-cause exposure.
Generate minimal cut sets, identify single-point paths, then quantify only where suitable data and assumptions exist.
Target high-consequence or important contributors, verify actions, update the tree and document residual risk and limitations.
“System fails” is too broad. Define a specific function, condition and boundary so the analyst knows exactly what the tree must explain.
If either input alone can cause the parent event, the gate is OR. Incorrect gate choice can dramatically distort both cut sets and probability.
“Component failure” may not be useful enough. Develop further where the decision needs a mechanism, design weakness, process cause or controllable contributor.
Multiplying two tiny probabilities can create an unrealistically tiny result if both events share power, software, environment, manufacture or maintenance exposure.
A top-event probability shown to many decimal places is not high-quality evidence if the basic-event data are rough estimates or the model is incomplete.
FTA is configuration-dependent. Design, supplier, software, architecture, mission profile or process changes may invalidate branches or probability assumptions.
Electrical energy unavailable; motor torque not produced; mechanical transmission cannot move the output; or control system inhibits/miscommands movement. Any one branch can produce the top event.
Examples include erroneous sensor feedback combined with diagnostic failure, or loss of both command channels. These are precisely the branches where dependency/common-cause review is most important.
Clear top event, scope, assumptions, event definitions, gate logic, supporting evidence and configuration.
Minimal cut sets, single-point paths, common-cause/dependency review, justified probability data and clearly stated limitations.
Prioritised risk-reduction actions, verification evidence, residual-risk conclusion and review/approval appropriate to the programme.
Click an event to edit it. Drag the background to pan and use the mouse wheel or zoom buttons to zoom. Select a cut set in Analysis to highlight its path.
| ID | Type | Event | Gate | Probability | Basis / source | Dependency |
|---|
Power, communications, cooling, grounds and connectors can defeat apparently separate paths.
Common requirements, algorithms, components or systematic defects may create correlation.
Batch, supplier, process, maintenance, contamination, temperature and vibration can affect multiple items.